Ключевые слова: LTS, Nb3Sn, bulk, vortex dynamics, pinning, measurement technique, microwave devices, surface impedance, flux flow resistance, upper critical fields, flux creep
Ключевые слова: measurement technique, microwave devices, surface impedance
Galluzzi V., Mancini A., Puig T., Celentano G., Palau A., Obradors X., Bartolome E., Augieri A., Pompeo N., Silva E., Torokhtii K., Alimenti A.
Ключевые слова: HTS, YBCO, films epitaxial, PLD process, chemical solution deposition, substrate LaAlO3, nanoscaled effects, anisotropy, impedance, angular dependence, magnetic field dependence, measurement technique, defects, nanorods, twin boundaries, nanoparticles, pinning mechanism, flux flow resistance, comparison
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, doping effect, nanoscaled effects, defects, surface impedance, vortex dynamics, pinning, defects columnar, experimental results
Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Tendeloo G.V., Pompeo N., Silva E., Torokhtii K., Meledin A., Frolova A., Armenio1 A.A., Mancini1 A., Pinto1 V., Feighan J., Celentano1 G., Rizzo1 F., Augieri1 A.
Ключевые слова: presentation, HTS, YBCO, films, films epitaxial, doping effect, nanoscaled effects, PLD process, pinning centers artificial, pinning force, density, magnetic field dependence, critical caracteristics, Jc/B curves, microstructure, defects columnar, critical current density, angular dependence, resistive transition, X-ray diffraction, temperature dependence, growth rate, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical caracteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
Petrisor T., Ciontea L., Celentano G., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Mos R.B., Nasui M., Pinto V., Piperno L., Frolova A.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Pinto V., Frolova A.
Ключевые слова: HTS, YBCO, thin films, nanorods, nanoscaled effects, pinning, anisotropy, PLD process, angular dependence, vortex dynamics, viscosity, flux creep
Ключевые слова: HTS, YBCO, thin films, nanoscaled effects, nanorods, PLD process, substrate SrTiO3, pinning, measurement technique, frequency dependence, experimental results
Ключевые слова: HTS, YBCO, thin films, substrate SrTiO3, PLD process, nanorods, nanoscaled effects, resistivity, flux flow, pinning, anisotropy, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Contini G., Freda R., Sotgiu G., Torokhtii K., Bemporad E.
Ключевые слова: HTS, YBCO, thin films, nanorods, nanoscaled effects, PLD process, flux flow resistance, pinning, upper critical fields, anisotropy, experimental results
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